返回The 2024 annual summary meeting of the National Key Research and Development Project "Spectral Analysis and Imaging Technology with Nanophotonic Chip Integration" was successfully completed
On the morning of November 16, 2024, the 2024 annual summary meeting of the National Key Research and Development Project, "Spectral Analysis and Imaging Technology with Nanophotonic Chip Integration", was held in the Rohm Building of Tsinghua University.
Seven experts from universities/enterprises and project director of the Research Department of Tsinghua University attended the meeting. Professor Yidong Huang, the project leader, and subproject leaders reported the main work and progress of the project in the past year. The experts at the meeting spoke highly of the completion of the work of the project in 2024, believing that the project is progressing smoothly, the task indicators and results are in line with the requirements of the task book, and put forward valuable opinions and suggestions for the next work.
