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The 2024 annual summary meeting of the National Key Research and Development Project "Spectral Analysis and Imaging Technology with Nanophotonic Chip Integration" was successfully completed

On the morning of November 16, 2024, the 2024 annual summary meeting of the National Key Research and Development Project, "Spectral Analysis and Imaging Technology with Nanophotonic Chip Integration", was held in the Rohm Building of Tsinghua University.

Seven experts from universities/enterprises and project director of the Research Department of Tsinghua University attended the meeting. Professor Yidong Huang, the project leader, and subproject leaders reported the main work and progress of the project in the past year. The experts at the meeting spoke highly of the completion of the work of the project in 2024, believing that the project is progressing smoothly, the task indicators and results are in line with the requirements of the task book, and put forward valuable opinions and suggestions for the next work.

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2024年11月20日

News

The 2024 annual summary meeting of the National Key Research and Development Project "Spectral Analysis and Imaging Technology with Nanophotonic Chip Integration" was successfully completed2024-11-20

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Ph.D candidate Zhiyao Ma's work about switchable metasurfaces was published on Nature Communications2024-09-30

Our technological achievements transformation enterprises joined hands to take part in 2024 CIOE2024-09-24

Ph. D candidate Dongning Liu and Master student Zhanping Jin participated in 21st Quantum Optics Conference and provided presentations2024-09-21

Optoelectronic Industry Summit Forum – “The Future of Optoelectronic Chip” Closed with Success2024-09-18

PhD student Mingzhong Hu participated in the 14th Conference of Quantum Imaging and received the Excellent Poster Award2024-09-13

Jiangbo Wang, Vice President of HC SemiTek (Zhejiang) Co., Ltd. visited our laboratory2024-09-09

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